About Laboratory
Our laboratory specializes in advanced material characterization, providing essential insights and data to researchers and industry professionals through sophisticated analytical technologies. We focus on supporting scientific discovery and industrial innovation by facilitating in-depth analysis of materials across various applications.
Our Mission
We are committed to enhancing material science research and industrial development through high-quality, reliable analytical services. Our mission is to empower researchers and professionals by providing access to state-of-the-art instrumentation and expert support, fostering innovation, education, and progress in the field.
Our Vision
Our vision is to be a leader in material science research, offering unparalleled expertise and resources to advance the understanding and application of material properties. We aim to drive technological and scientific breakthroughs by enabling precise and comprehensive material characterization.
Laboratory Equipment
PANalytical X'Pert PRO X-Ray Diffractometer (XRD)
Description: The PANalytical X'Pert PRO X-Ray Diffractometer is a state-of-the-art instrument designed for detailed analysis of crystalline materials. It utilizes X-ray diffraction to provide insights into the crystallographic structure, phase composition, and other structural parameters of a wide range of materials.
- Phase Identification: Determines the different crystalline phases present in a sample.
- Crystallinity Assessment: Evaluates the degree of crystallinity and detects amorphous content.
- Lattice Parameter Determination: Measures precise lattice constants for unit cell characterization.
- Stress and Strain Analysis: Assesses residual stresses and micro-strains within crystalline materials.
- Texture and Orientation Studies: Analyzes preferred crystallographic orientations in polycrystalline samples.
- Thin Film Analysis: Characterizes thin films, coatings, and multilayer structures for thickness and composition.
FEI Quanta 450 Scanning Electron Microscope (SEM) with Bruker EDS
Description: The FEI Quanta 450 SEM is a high-resolution imaging tool that provides detailed surface morphology and topographical information of materials at the micro to nanoscale. Equipped with variable pressure capabilities, it allows for the examination of both conductive and non-conductive samples with minimal preparation.
- High-Resolution Imaging: Visualizes surface structures, fractures, and defects at magnifications up to 1,000,000x.
- Elemental Composition Analysis: Identifies and quantifies elemental makeup using EDS technology.
- Microstructural Characterization: Studies grain sizes, phases, and inclusions within materials.
- Failure Analysis: Investigates the causes of material failures through detailed imaging and compositional analysis.
- Particle Analysis: Examines particle size distribution and morphology in powders and suspensions.
- Surface Coating Evaluation: Assesses the uniformity and composition of coatings and thin films.
SKYRay Portable X-Ray Fluorescence (XRF) Analyzer
Description: The SKYRay Portable XRF Analyzer is a handheld instrument designed for rapid, non-destructive elemental analysis. Its portability allows for on-site testing and real-time decision-making in various environments, from fieldwork to industrial settings.
- Elemental Analysis: Provides quick identification and quantification of elements from Magnesium (Mg) to Uranium (U).
- Environmental Assessment: Analyzes soil, sediment, and water samples for contaminants like heavy metals.
- Mining and Geology: Assists in mineral exploration by identifying ore compositions and concentrations.
- Quality Control in Manufacturing: Ensures material specifications are met in metal fabrication and alloy production.
- Art and Archaeology: Verifies the authenticity and composition of artifacts without causing damage.
- Scrap Metal Sorting: Facilitates the rapid identification of metal types for recycling purposes.
